The influence of the internal microstructure on the surface parameters of polycrystalline thin films Article in MRS Online Proceeding Library Archive 672 · January 2001 with 11 Reads. The offset 111 texture observed in the third regime of AlCu film microstructure was due to the faceting of grain surfaces. The time required for the films to reach these three stages depended on the effective diffusivity of the Al atoms on the ILD surfaces, which differed in chemistry and topography. Jan 01, 2019 · To demonstrate the high-temperature K enhancement mechanism of LDPE/BNNS, in-situ SAXS was further utilized to investigate the microstructure evolution with temperature increasing.L W of LDPE and LDPE/BNNS both increase with temperature, as shown in Fig. 3a and b. It’s difficult for the LDPE crystalline regions to thermally expand before melting, therefore the variation of L W is. Volume 280 Symposium B – Evolution of Surface and Thin Film Microstructure 1992, 109 Rem and Rheed Studies of Pb Adsorption on Si111 Yasumasa Tanishiroa1, Masahiko Fukuyamaanda1and Katsumichi Yagia1. Journal description. The MRS Online Proceedings Library Archive includes more than 100,000 peer-reviewed papers online—proceedings published from Volume 1 through the 2015 MRS Spring Meeting.
Freestanding nickel thin films of a dog-bone shape produced at Sandia National Labs were used in this study. The thin films were fabricated from a sulfamate bath at a current density of 50 mA cm −2. Two film thicknesses 70 and 270 μm were produced for an. 978-1-107-41190-6 - Materials Research Society Symposium Proceedings: Volume 721: Magnetic and Electronic Films Microstructure, Texture and Application to Data Storage Editors: Patrick W. DeHaven, David P. Field, Samuel D. Harkness IV, John A. Sutliff, Jerzy A. Szpunar, Li Tang, Thomas Thomson and Mark D. Vaudin Frontmatter More information. Jan 01, 2019 · These thin films were annealed at 800 Â°C. 1558 S. Tongpeng et al. / Materials Today: Proceedings 17 2019 1555â€“1560 Therefore, the SEM results suggested that the mole ratio of HNO3:DI water had a significant effect on the microstructure of the HfO2 thin films.
May 27, 2011 · ZnO films with an embedded silver layer, one of the most promising transparent conductive materials, possess excellent conductivity and optical transmittance. The performance of ZnO films is greatly affected by the morphology of the silver layer. In this work, we studied the changes in the electrical and optical properties of ZnO/Ag multilayered films as a function of the coalescence of the. The stress evolution during and after dc magnetron sputter deposition of Cu thin films with thicknesses of 20 and 300 nm and deposited with a constant rate of 0.1nm∕s onto Si 100 substrates is studied for various sputtering pressures 0.05–6 Pa. The stress was determined by means of in situ wafer curvature measurements using an optical two-beam deflection method. Mechanisms of surface and microstructure evolution in deposited films and film structures. Warrendale, Pa.: Materials Research Society, 2001 OCoLC604165949: Material Type: Conference publication, Internet resource: Document Type: Book, Internet Resource: All Authors / Contributors: Jacques Genissieux Amar.
Feb 25, 2016 · The stress state and evolution up to the relaxation onset are monitored during the growth of oxygen ion conducting Ce 0.85 Sm 0.15 O 2-δ thin films via optical wafer curvature measurements. Evolution of Surface and Thin Film Microstructure: Editors: Harry A. Atwater, Eric Chason, Marcia H. Grabow, Max G. Lagally: Publisher: Publ by Materials Research Society: Pages: 571-576: Number of pages: 6: ISBN Print 1558991751: State: Published - Dec 1 1993: Event: Proceedings of the 1992 Fall Meeting of the Materials Research Society. Jul 13, 2020 · f. m. ross et al., “changes in electronic device properties during the formation of dislocations”, in evolution of surface and thin film microstructure, 1993, vol. 280, pp. 483-492. F. M. Ross et al., “CHANGES IN ELECTRICAL DEVICE CHARACTERISTICS DURING THE FORMATION OF DISLOCATIONS IN-SITU IN THE TEM”, in MICROSCOPY OF SEMICONDUCTING MATERIALS.
Apr 01, 2014 · Fig. 2 shows the deposition rate dependence of the turnaround behavior in Ni films deposited at 373 K. The deposition rates were kept constant at 0.5 Å s-1 during growth of the initial 15 nm in all cases, to ensure that the films had similar grain structures right after coalescence. From 15 to 100 nm, deposition rates were 2.5, 1.3, 0.8, 0.5 and 0.3 Å s-1, respectively. Drucker, J 1993, Microstructural evolution and coherent islands. in HA Atwater, E Chason, MH Grabow & MG Lagally eds, Evolution of Surface and Thin Film Microstructure. Materials Research Society Symposium Proceedings, vol. 280, Publ by Materials Research Society, pp. 389-392, Proceedings of the 1992 Fall Meeting of the Materials Research. Aldrich, DB, Sayers, DE & Nemanich, RJ 1993, Investigation of titanium silicon and germanium reaction. in HA Atwater, E Chason, MH Grabow & MG Lagally eds, Evolution of Surface and Thin Film Microstructure. Materials Research Society Symposium Proceedings, vol. 280, Publ by Materials Research Society, pp. 585-588, Proceedings of the 1992 Fall Meeting of the Materials Research Society.
Microstructure evolution, where grain boundaries evolve by mean curvature motion, is modeled in three dimensions 3-D using gradient-weighted moving finite elements GWMFE. To do this, we modify and extend an existing 2-D GWMFE code to create a new code GRAIN3D which makes the 3-D microstructure modeling possible. The right-hand side term which drives the GWMFE motion can be. Jan 14, 2020 · P. C. MCINTYRE and Cima, M. J., “MICROSTRUCTURAL EVOLUTION DURING EPITAXIAL-GROWTH OF CHEMICALLY DERIVED BA2YCU3O7-X THIN-FILMS”, in Evolution of Surface and Thin Film Microstructure, vol. 280, 1993, pp. 371-374. V.T. Srikar and C.V. Thompson, Modeling Of Grain Structure Evolution And Its Impact On The Reliability Of AlCu Thin Film Interconnects, MRS Symposium Proceedings, 516, 71 1998. C83. S.P. Riege, V. Andleigh, C.V. Thompson, and H.J. Frost, Modeling Of Grain Structure Evolution And Its Impact On The Reliability Of AlCu Thin Film.
This paper presents the nanoindentation investigation of the evolution of concrete microstructure modified by the Internal Crystallization Technology mineral powders. The samples under study were retrieved from a fragment of a circular concrete lining of the vertical mine shaft at. Silver thin films were prepared by direct current DC magnetron sputtering technique in Ar/N 2 atmosphere with various N 2 volumetric ratios on Si substrates. Silver thin films prepared in pure Ar atmosphere show highly 111 preferred orientation. However, as the N 2 content increases, Ag 111 preferred orientation evolves into 100 preferred orientation gradually.
Yi-Chen Chen, Yung-Tang Nien, Microstructure and photoluminescence properties of. T. Tsukamoto, S. Niki, N. B. Dahotre, Evolution of microstructure in BaTiO 3 thin films recrystallised by laser, Surface. Laser Rapid Sintering of Metallo-Organic Derived Oxide Films, MRS Proceedings, 10.1557/PROC-201. M. I. Zeifman, B. J. Garrison, and L. V. Zhigilei, Evolution of a plume in laser ablation: dependence on the spot size, Proceedings of the 36th AIAA Thermophysics Conference, AIAA Paper 2003-3493, 2003. Abstract, Full Text: PDF 106 kB. Apr 20, 2012 · During deposition, many thin films go through a range of stress states, changing from compressive to tensile and back again. In addition, the stress depends strongly on the processing and material parameters. We have developed a simple analytical model to describe the stress evolution in terms of a kinetic competition between different mechanisms of stress generation and relaxation at the.
In H. A. Atwater, E. Chason, M. H. Grabow, & M. G. Lagally Eds., Evolution of Surface and Thin Film Microstructure pp. 173-178. Materials Research Society Symposium Proceedings; Vol. 280. Publ by Materials Research Society. May 11, 2020 · Polymorphic Hf x Zr 1−xO 2 HZO thin films exhibit ferroelectric, dielectric, and antiferroelectric properties across a wide compositional range due to the existence of orthorhombic, monoclinic, and tetragonal phases. To better understand the phase stability across the HfO 2 –ZrO 2 compositional range, we investigate the structural evolution of HZO thin films in situ via high. INTERFACIAL ENERGY, J. A. Floro, R. Carel, and C. V. Thompson, Proceedings of the 1993 Fall Symposium of the Materials Research Society. presented by JAF at 1993 MRS Spring Symposium NUMERICAL ANALYSIS OF INTERFACE-ENERGY-DRIVEN COARSENING IN THIN FILMS AND ITS CONNECTION TO GRAIN GROWTH, J. A. Floro and C.V. Thompson, Acta. Metall. Motta, L. Tan, and T. R. Allen, “Influence of Alloy Microstructure on Oxide Growth in HCM12A in Supercritical Water,” Materials Research Society MRS Proceedings Symposium R: Materials for Future Fusion and Fission Technologies, 2008, paper ID R519941.
Feb 23, 2016 · Manufacturing of sheet like structures, joining due to coalescence and solidification of undercooled liquid metal particles referred to as heat-free mechanical soldering, joining of thin metal films 200 nm thick, and, healing surface defects in thin films 200 nm using the undercooled particles are demonstrated. Aug 28, 2018 · Fig. 1. Electron tomography of isolated polyamide films to reveal 3D microstructure. A Schematic of polyamide isolation protocol.B AFM micrographs of the polyamide top surface of the pristine and isolated SWHR-C membrane after cross-flow compression showing minimal surface changes during the polyamide isolation process.C Schematic of the HAADF-STEM tomography tilt. Kevin Hemker, the Alonzo G. Decker Chair and professor of mechanical engineering, is known for work explaining the underlying, atomic-level details that govern the mechanical response, performance and reliability of disparate material systems. He holds joint appointments in the departments of Materials Science and Engineering, and Earth and Planetary Sciences. Hemker’s research group has.
In: Materials Research Society Symposium - Proceedings, Vol. 546, 01.12.1999, p. 27-32. Research output: Contribution to journal › Conference article Zhang, X, Zhang, TY & Zohar, Y 1999, ' Rapid thermal annealing for residual-stress relaxation in undoped or doped polysilicon thin films ', Materials Research Society Symposium - Proceedings. Oct 25, 2011 · Compressive stress due to intermetallic IMC growth appears to be the main driving force for whisker formation, but many of the underlying mechanisms relating the IMC to stress and whisker formation are not understood. To better understand these fundamental processes, we have measured IMC, stress and whisker evolution in Sn layers deposited on Cu. We present systematic results of the. D. Kaoumi, Arthur T Motta and R. C. Birtcher, 2006, "Irradiation-enhanced second-phase precipitation in Zr-Fe nanocrystalline thin films", Proceedings of the Symposium on Growth, Modification, and Analysis by Ion Beams at the Nanoscale, Materials Research Society Symposium Proceedings, 908E, pp. 0908-OO04-04.1 - 4.6. A.A. Maznev, M. Gostein, and S.H. Brongersma, "Characterization of electroplated copper films with laser-generated surface acoustic waves", in Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, Materials Research Society Proceedings Vol. 766, Materials Research Society, Warrendale, 2003 p. 415-420.
Microstructure evolution and photoluminescence properties of boron nitride nanospheres under extreme thermal processing. Ceramics International 2017, 43 17, 15402-15409. “Influence of Laser Fluence on the Microstructure Evolution and Fractal Dimensions of Laser Surface Modified Alumina Ceramic”, Sandip P. Harimkar and Narendra B. Dahotre, Materials Characterization, Vol. 59, pp. 700-707, 2008. Abstract: This paper contributes to the characterization of the thin oxide films formed on Alloy 690 in three water chemistry conditions pH 300 7.4 without Zn injection, pH 300 7.2 without Zn. Journal Papers 2019 - S. Lösch, A. Alfonsov, O.V. Dobrovolskiy, R. Keil, V. Engemaier, S. Baunack, G. Li, O.G. Schmidt, D. Bürger Microwave Radiation Detection with. Rauf et al. revealed into the effects of thickness on microstructure, mechanical properties and soft magnetic properties of Fe 75 Zr 25 thin film metal glass prepared by dc magnetron sputtering. However, the above studies mainly focused on the mechanical properties and forming ability of MG, and there was little research on the field of nano.
In this work, the structural and mechanical properties of ternary Mo-Al-N alloys are investigated by combining thin film growth experiments and density functional theory DFT calculations. Mo1−xAl.
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