Mar 18, 2004 · When optical measurements of wafer curvature are used to determine thin-film stress, the laser beams that probe the sample are usually assumed to reflect specularly from the curved surface of the film and substrate. Yet, real films are not uniformly thick, and unintended thickness gradients produce optical diffraction effects that steer the laser away from the ideal specular condition. Jan 16, 2020 · The correlation between the structural phase transition SPT and oxygen vacancy in SrRuO 3 SRO thin films was investigated by in situ X-ray diffraction XRD and ambient pressure X-ray photoelectron spectroscopy AP-XPS. In situ XRD shows that the SPT occurs from a monoclinic SRO phase to a tetragonal SRO phase near ∼200 °C, regardless of the pressure environment. Aug 13, 2008 · This option allows users to search by Publication, Volume and Page Selecting this option will search the current publication in context. Selecting this option will search all publications across the Scitation platform Selecting this option will search all publications for the Publisher/Society in context.
"In-Situ Observations of High Temperature Surface Processes on alpha-Alumina Bulk Crystals", Z.L. Wang and J. Bentley, in Advances in Surfaces and Thin Film Diffraction, eds. T.C. Huang, P.J. Cohen and D.J. Eaglesham, MRS Symposium Proceedings, 208 1991 155-160. In order to finalize this study a silver based thin film anode was associated to a 5 V Li 1.2 Mn 1.5 Ni 0.5 O 4 thin film cathode in a LiPF 6-EC-PC-DMC electrolyte. A capacity close to 25 μAh/cm 2 over 1000 cycles at an average working voltage of 4.65 V was obtained.
Interfacial Engineering for Optimized Properties II Ed. With Ernie Hall, Steve Nutt and Clyde Briant, Volume 586 of the MRS Symposium Proceedings 2000. EBSP of Ceramics Materials with Jeff Farrer and Joe Michael in Electron Backscatter Diffraction in Materials Science, Eds Adam Schwartz, Mukel Kumar and Brent Adams Plenum, New York 2000. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS VOLUM E 589 Advances in Materials Problem Solving With the Electron Microscope Symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A. The growth of diamond films on various polycrystalline metal and 001 Si substrates by biased hot‐filament chemical vapor deposition is discussed. The deposited films have been characterized by scanning electron microscopy, x‐ray diffraction, Auger electron spectroscopy, and Raman spectroscopy. Films grown on Si, Ni, and W exhibited the best quality according to Raman sp 3 /sp 2 peak. Ali Motazedifard, S. Dehbod, and A. Salehpour, "Measurement of thickness of thin film by fitting to the intensity profile of Fresnel diffraction from a nanophase step," J. Opt. Soc. Am. A 35, 2010-2019 2018. Jul 13, 2020 · f. m. ross and gibson, j. m., “high-energy transmission electron-diffraction from surface monolayers during silicon oxidation”, in advances in surface and thin film diffraction, 1991, vol. 208.
Volume 208 Symposium J – Advances in Surface and Thin Film Diffraction 1990, 63 Evidence of Quantum Motion of Hydrogen on Pd111 in He-Diffraction data C-H. Hsu a1, B. E. Larson a1, M. El-Batanouny a1, C. R. Willis a1 and K. M. Martini a2. Oxygen self-diffusion in cerium oxide doped with Nd - Volume 16 Issue 1 - Michiyo Kamiya, Eriko Shimada, Yasuro Ikuma, Manabu Komatsu, Hajime Haneda, Soichiro Sameshima, Yoshihiro Hirata. Sep 05, 2002 · Tungsten nitride WN x thin films were deposited by reactively sputtering a pure W target in an argon/nitrogen atmosphere. The nitrogen concentration in the growth chamber was varied from 2% to 60%. Film growth and properties were studied as a function of nitrogen concentration in the films. The cathode current and voltage variations during the film growth indicated cathode poisoning.
Jul 12, 2019 · X-ray diffraction XRD, UV-Vis spectrophotometer and scanning electron microscope SEM technologies were used to characterize the film. The photocatalytic activities of the samples were tested on the degradation of methylene blue MB dye. Crystalline size and phases of the thin films were calculated by using XRD. Jan 01, 2019 · For the silicon wafer samples showed slightly changes of the XRD pattern onto 400 plane at angle of 69.05 degrees  -JCPDS No. 27-1402, but does not appear the peak of the alumina thin film. Figure 7. X-ray diffraction patterns a Indication of Al2O3 plane 110 in the alumina thin films on FTO / TiO2 b Showing of slightly change of. Jun 21, 2006 · Visible light active nitrogen doped titanium oxide TiOxNy thin films were deposited by dc reactive magnetron sputtering on glass substrates at different nitrogen flow rates and sputtering pressures. All the deposited films consist of composite of TiOxNy and TiO2 phases of anatase and a small portion of the rutile R phase was embedded in the polycrystalline films. X-ray diffraction and. Thin films for photovoltaic and related device applications: symposium held April 8-11, 1996, San Francisco, California, U.S.A. Volume 426 of Materials Research Society symposia proceedings Volume 426 of MRS Symposium Proceedings Series MRS Proceedings: Editor: David S. Ginley: Publisher: Materials Research Society, 1996: Original from: the. The electrical resistivity of films is highly dependent on the solvent type which exhibited the lowest value with distilled water. Furthermore, GO film synthesized with distilled water has the best values of adhesion force and average surface roughness Ra 143.4 mN/m and ~ 7.83 μm, respectively.
Nov 16, 2001 · The topmost surface layer arrangement and thus the surface morphology seem to be dependent on polytype and orientation of the sample, and on the particular preparation treatment. In several cases of nominally Si rich orientated samples such as 6H‐SiC0001 step bunching can be found. Then a linear surface layer stacking is preferred. Feb 14, 2018 · Perovskite oxides are characterized by the chemical formula ABO 3, where A and B are two cations, with A larger than B, and O is an oxygen anion.The ideal perovskite structure is cubic with space group Pm-3m, as illustrated in figure 1a.The B cations represented in orange are 6-fold coordinated with the O anions red, forming the BO 6 octahedra that constitute the fundamental. May 01, 2002 · Preparation of Microporous Films with Sub Nanometer Pores and their Characterization Using Stress and FTIR Measurements. MRS Proceedings 1996, 431 DOI: 10.1557/PROC-431-185. M. T. Anderson, J. E. Martin, J. G. Odinek, P. Newcomer. Synthesis of Periodic Mesoporous Silica Thin Films. MRS Proceedings 1996, 431 DOI: 10.1557/PROC-431-217.
2012 Motion of Elastic Thin Films by Anisotropic Surface Diffusion with Curvature Regularization. Archive for Rational Mechanics and Analysis 205:2, 425-466. 2012 Nonlinear Wavelength Selection in Surface Faceting under Electromigration. Jan 30, 2014 · Read open access proceedings from science conferences worldwide. Books. Publishing Support. Login. Login. Forgotten password? Create account. Benefits of a My IOPscience account. Login via Athens/your Institution. Primary search Search. The crystallite sizes were determined using the well-known Scherrer equation: where is a dimensionless constant often called the shape factor with a value of 0.9, is the wavelength of the X-ray radiation, is the full width at half maximum FWHM of the diffraction peak, and is the diffraction angle in degrees. The calculated average grain sizes are 10.98 nm, 23.88 nm, 14.38 nm, 14.10 nm, 12.75. Jan 21, 2020 · Sensing film of the functionalized Graphene oxide BGO was prepared by Langmuir-Blodgett LB technique. The LB has the advantage of good quality of thin films over other deposition methods e.g. sol-gel, spin coater. 20 mg of the BGO was dispersed in 20 ml of DMF by ultrasonication for several hours to achieve good homogenous suspension.
A thin metal film near-field superlens, as originally suggested by Pendry and realized by Fang et al. and Melville et al., is investigated with emphasis on materials suitable for integration on a lab-on-a-chip platform. A chemically resistant cyclo-olefin copolymer COC, mr-I-T85 from microresist technology, is applied as dielectric matrix/spacer for an Ag thin film superlens. Apr 02, 2003 · The gold film thickness and its corresponding surface roughness could be easily controlled by setting the electroless deposition time. X-ray diffraction certified uniformity of deposits with the Au111 crystallographic structure as the predominant one.
Oxygen-Induced Reversible Structural Change of Supported fine Silver Particles Observed by In Situ Optical Absorption and X-ray Diffraction. MRS Proceedings 1990, 195 DOI: 10.1557/PROC-195-31. R. Abermann, R. Koch. The internal stress in thin silver, copper and gold films. Fig. 1 Crystal structure characterization of epitaxial composite films. A Out-of-plane XRD of 001 peaks of PT I, PT II, and PT III epitaxial thin films on 100 STO substrates. a.u., arbitrary units.B Synchrotron-based 103 x-ray RSM study of PT I, PT II, and PT III epitaxial thin films about the STO 103 diffraction condition.L, crystal index of 00l; H, crystal index of. Applied Surface Science, Elsevier Science B.V., Volumes 208-209, Pages 1-687 15 March 2003, Proceedings of the E-MRS 2002 Spring Meeting Symposium D 2. Advances in Laser and Lamp Processing of Functional Materials. Materials such as W, TiN, and SrRuO3 SRO have been suggested as promising alternatives to Au and Ag in plasmonic applications owing to their stability at high operational temperatures. However, investigation of the reproducibility of the optical properties after thermal cycling between room and elevated temperatures is so far lacking. Here, thin films of W, Mo, Ti, TiN, TiON, Ag, Au, SrRuO3.
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